Fault Coverage Measurement Technique for Analog Circuits
نویسندگان
چکیده
This report describes an effort to develop a technique for measuring the amount of fault detection coverage that an analog test pattern has for a particular analog device. The technique is based on a software tool which statistically analyzes data from a circuit simulator. One example of a fault simulation experiment is presented, and some of the results are discussed. Finally, some ideas for future work in this area are given.
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تاریخ انتشار 2013